Scanning Probe Microscope

Scanning probe microscopy (SPM) is a type of microscopy in which images of surfaces are created using a physical probe that scans the specimen. The scanning tunnelling microscope, an instrument for imaging surfaces at the atomic level, was invented by SPM in 1981. Gerd Binnig and Heinrich Rohrer successfully conducted the first scanning tunnelling microscope experiment.

  • Atomic Force Microscope
  • Scanning Capacitance Probe Microscope
  • Ballistic electron emission microscopy (BEEM)
  • Chemical force microscopy (CFM)
  • Conductive atomic force microscopy (C-AFM)
  • Electrochemical scanning tunneling microscopy (ECSTM)
  • Electrostatic force microscopy (EFM)
  • Fluidic force microscopy (FluidFM) etc.

Market Analysis:  By the end of 2026, the global scanning probe microscope market is expected to be worth nearly US$ 900 million. Scanning probe microscope demand is expected to grow at a CAGR of 7.1 percent during the forecast period. For More Details: https://materialsscience.peersalleyconferences.com/tracks/scanning-probe-microscope

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